Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes

Frequency-modulation atomic force microscopy (AFM) with a qPlus sensor allows one to atomically resolve surfaces in variety of environments ranging from low-temperature ultra-high vacuum ambient and liquid conditions. Typically, the tip is driven oscillate vertically, giving measure vertical component. However, for many systems, lateral component provides valuable information about sample. Measuring components simultaneously by oscillating vertically laterally has so far only been demonstrated relatively soft silicon cantilevers optical detection. Here, we show that can be used biaxial mode electrical detection making use first flexural length extensional mode. We describe necessary electrode configuration as well circuit compare needle sensor. Finally, resolution conditions mica surface surface. In addition this, how any AFM setup modified work sensor, allowing two independent recorded.